We accept measurements related to electric contact measurement.
Measurement of contact resistance with actual work is also possible.
We encourage you to use our services to eliminate any anxiety or concern for using contact probes.
We are also ready to accept consultation work. Please do not hesitate to contact us.
Services | Measuring Instrument Used | Brief Summary of Measurement |
---|---|---|
Measurement of resistance | Load/contact resistance testing apparatus | Automatic acquisition of resistance is possible for random loads (50 g to 8,000 g). |
Automatic acquisition of resistance is possible for random strokes. | ||
Contact probe durability experiment A | Automatic durability testing apparatus | Automatic acquisition of resistance is possible for random contact values. |
Contact probe durability experiment B | Cam type durability testing apparatus | Observation of displacement in contact resistance is possible for random durability counts. |
Load-resistance correlation testing apparatus | The probe can be detached from the durability testing apparatus at random counts for combinations with large-current application experiment, temperature experiment, and resistance measuring experiment. | |
Large-current application experiment | Low-profile stabilized power supply | Application of current up to 400 A is possible (subject to the conditions). |
Digital multimeter | Check of heat-generating state during current application is possible. | |
Infrared thermography | Measurement of voltage fluctuation and resistance value during current application is possible. | |
Temperature experiment | Constant-temperature bath | Measurement of contact resistance values is possible under the temperature environment at random temperatures (-180°C to 300°C). |
Milliohm HiTester 3560 | ||
Observation of contacting area | Real surface view microscope | Observation of state of deformation work and probe after contact is possible. |
Image dimension measuring apparatus | Observation of state of deformation work and probe after contact is possible. Acquisition of deformation values can also be acquired. | |
SmartScope | ||
Shape measurement laser microscope | ||
Analysis of components at contacting area | Real surface view microscope | Check of components of foreign materials attached to the contact area of work or probe is possible |
Energy dispersive X-ray analyzer | ||
Thermal simulation software | - | The heat-generating state during measurement can be simulated based on the current-application time, current values, and contact resistance values. |